Single-event Effects

Single-event effects (SEE) are the unexpected and undesirable effects caused by the interaction of high-energy particles with electronic devices in space. These particles can cause temporary or permanent changes in the device's behavior, such as bit flips, latch-ups, and burnouts. Single-event effects can occur in any electronic device, including microprocessors, memory chips, and power devices. They are a major concern for space and astronautical engineers because they can cause system failures and mission loss. To mitigate the impact of single-event effects, engineers use radiation-hardened devices, shielding, redundancy, and error-correction techniques.

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Single-event Effects

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