Transmission Electron Microscopy

Transmission Electron Microscopy (TEM) is a type of electron microscopy that uses a beam of electrons to create an image of a thin sample. In TEM, the electron beam is transmitted through the sample, and the resulting image is formed by the interaction of the electrons with the sample. TEM is capable of achieving extremely high magnifications, up to 10 million times, and can provide detailed information about the internal structure of materials at the atomic scale. TEM is widely used in materials science, nanotechnology, and biology to study the structure and properties of materials and biological specimens.

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Transmission Electron Microscopy

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