Scanning Tunneling Microscopy

Scanning Tunneling Microscopy (STM) is a technique used in space and astronautical engineering to image surfaces at the atomic level. It works by scanning a sharp metal tip over the surface of a sample, and measuring the tunneling current that flows between the tip and the sample. By maintaining a constant tunneling current, the tip can be moved up and down to maintain a constant distance from the sample surface, allowing for the creation of a three-dimensional image of the surface topography. STM has been used to study the properties of materials in space, including the electronic structure of surfaces, the behavior of molecules on surfaces, and the growth of thin films and nanostructures.

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Scanning Tunneling Microscopy

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